CIO Influence
CIO Influence News Networking

Advantest Introduces New T5835 Memory Tester for Advanced DRAMs and NAND Flash Devices with High-Speed Interfaces

Advantest Introduces New T5835 Memory Tester for Advanced DRAMs and NAND Flash Devices with High-Speed Interfaces
Newest Addition to T5800 Product Family More than Doubles Testing Speed to 5.4 Gbps, Providing High Throughput and Reducing Cost of Test

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced the newest cost-efficient, high-volume memory tester in its industry-leading T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices.

Interface speeds on both volatile and nonvolatile memory ICs are continuing to accelerate. Market trends indicate that mid-speed final testing of DRAM cores is increasing to achieve an optimal balance of reliability, test coverage and cost efficiency. Interface speeds for testing NAND memories can be more than 2 Gbps for today’s high-speed devices and are projected to exceed 4 Gbps for upcoming nonvolatile memories. IC makers need a test solution that can keep pace with escalating performance requirements while also maintaining or improving the overall cost of test.PREDICTIONS SERIES 2022

 Top iTechnology Automation News: Top Colombian Law Firm Gómez-Pinzón Goes Live On iManage Closing Folders

The new T5835 has full testing functionality for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to double-data-rate (DDR) and low-power double-data-rate (LPDDR) DRAM chips. In addition, the system’s built-in dedicated hardware functions allow it to reach industry-leading throughput levels, lowering the cost of test. It can handle 768 devices simultaneously for final package-level testing.

System capabilities include known-good-die (KGD) wafer-level testing of DRAMs, an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.

The T5835 is designed on the modular enhanced T5800 series platform to optimize scalability, flexibility and performance for both wafer sorting and final testing. It can be configured as either an engineering station for use in R&D environments or as a production-volume tester equipped with a small, medium or large test head.

Top iTechnology Networking News: Gilead and AWS Collaborate on Development and Delivery of New Medicines for Patients

All system configurations are inherited from Advantest’s existing memory test system and leverage the Future Suite operating system to provide continuing test program compatibility. These features allow users to seamlessly transition from previous generations of the T5800 series while maintaining production efficiency.

“On the strengths of its high performance and versatile capabilities, our new T5835 is truly today’s best-in-class memory tester and a first-class extension of the T5800 series,” said Masayuki Suzuki, executive vice president of the Memory Test Business Unit with Advantest Corporation. “It continues the legacy of our T5800 product family, which has been acknowledged as the global standard in the market.”

Top iTechnology Security News: BlueCat Announces Integration With AWS to Help Enterprises Manage IP Space in Cloud Environments

[To share your insights with us, please write to sghosh@martechseries.com]

Related posts

Accurics Redefines Secure GitOps with Argo Integration for Open Source Terrascan

CIO Influence News Desk

Syniti’s Rapid Data Governance Solution Is Now an SAP Endorsed App Available on SAP Store

PR Newswire

Leave a Comment